Methods of forming semiconductor device structures, and methods of forming capacitor structures

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United States of America Patent

PATENT NO 10090376
APP PUB NO 20150118821A1
SERIAL NO

14065662

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Abstract

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A method of forming a semiconductor device structure comprises forming a mold template comprising trenches within a mold material. Structures are formed within the trenches of the mold template. A wet removal process is performed to remove the mold template, a liquid material of the wet removal process remaining at least in spaces between adjacent pairs of the structures following the wet removal process. A polymer material is formed at least in the spaces between the adjacent pairs of the structures. At least one dry removal process is performed to remove the polymer material from at least the spaces between the adjacent pairs of the structures. Additional methods of forming a semiconductor device structure, and methods of forming capacitor structures are also described.

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Patent Owner(s)

  • MICRON TECHNOLOGY INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Greeley, J Neil Boise, US 11 1005
Millward, Dan B Boise, US 79 3347

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