IDENTIFYING SUBSURFACE MATERIAL LAYER
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United States of America Patent
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Issued Date -
Apr 30, 2015
app pub date -
Oct 29, 2014
filing date -
Oct 31, 2013
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Published
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Abstract
In an approach for identifying subsurface material layers, a computer processor: acquires a well log of a location to be explored, the log comprising data corresponding to multiple geophysical parameters, the data of each parameter comprising measurement values of the parameter at different depths underground; matches a reference data of each parameter corresponding to each of multiple layer transition types with the data of that parameter in the well log at depths underground, wherein each layer transition type indicates an upper material layer and a lower material layer, and the reference data is used to represent a variation trend of the parameter in a transitional zone conforming with the layer transition type; and according to the matching result, determines a layer transition type at the location to be explored and a depth of an interface between the upper material layer and the lower indicated by the layer transition type.
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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
INTERNATIONAL BUSINESS MACHINES CORPORATION | NEW ORCHARD ROAD ARMONK NY 10504 |
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- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Dong, Wei S | Beijing, CN | 7 | 36 |
Huang, Wen Q | Beijing, CN | 2 | 6 |
Ma, Chun Y | Beijing, CN | 2 | 4 |
Tian, Chunhua | Beijing, CN | 28 | 369 |
Wang, Yu | Beijing, CN | 1271 | 7147 |
Yan, Junchi | Shanghai, CN | 42 | 167 |
Zhang, Chao | Beijing, CN | 502 | 6727 |
Zhang, Xin | Beijing, CN | 788 | 3704 |
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