MEASUREMENT INFORMATION MANAGEMENT SYSTEM, MEASUREMENT DEVICE, MEASUREMENT INFORMATION MANAGEMENT METHOD, AND MEASUREMENT INFORMATION MANAGEMENT PROGRAM

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United States of America Patent

APP PUB NO 20150124571A1
SERIAL NO

14528136

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A measurement information management system includes: a measurement device; and a mobile information device, in which the measurement device includes a detail information generation unit which generates detail information including position information obtained by measuring position information, a title information transmission unit which transmits title information for identifying the detail information to the mobile information device, and a detail information transmission unit which transmits the detail information to the mobile information device according to a transmission request signal, and the mobile information device includes a detail information request unit which transmits the transmission request signal of the detail information of which the estimated transfer time necessary for transmitting the detail information corresponding to the title information transmitted from the measurement device from the measurement device to the mobile information device is determined to be shorter than a predetermined threshold value set in advance, to the measurement device.

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Patent Owner(s)

Patent OwnerAddress
SEIKO EPSON CORPORATIONTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HIRABAYASHI, Shinji Shiojiri-shi, JP 49 2386

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