MICROANALYSIS METHODS AND SYSTEMS USING FIELD EFFECT TRANSISTOR

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United States of America Patent

SERIAL NO

14601171

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Abstract

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Provided is a microanalysis method and system using a Field Effect Transistor (FET). The microanalysis method includes a channel region having a receptor molecule fixed; forming a nano-particle conjugate in the channel region by supplying a sample for test and the nano-particle conjugate to the FET; growing a probe material on the channel region; and measuring a current flowing through the channel region, wherein the receptor molecule is a material that is selectively bonded to a target molecule in the sample for test.

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Patent Owner(s)

Patent OwnerAddress
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTEDAEJEON-SI 305-700

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
AH, Chil Seong Daejeon, KR 54 268
AHN, Chang-Geun Daejeon, KR 42 356
PARK, Chan Woo Daejeon, KR 165 1122
SUNG, Gun Yong Daejeon, KR 61 388
YANG, Jong-Heon Daejeon, KR 41 373

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