Calibrating dual ADC acquisition system
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United States of America Patent
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Apr 26, 2016
Grant Date -
May 21, 2015
app pub date -
May 16, 2013
filing date -
May 18, 2012
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Abstract
A method of calibrating a dual gain ADC detector system is disclosed comprising passing a test signal through a high gain signal path to produce a first signal and passing a test signal through a low gain signal path to produce a second signal. A time difference between the first signal and the second signal is then determined. Data from the two ADCs is then stitched to form a composite mass spectrum without needing to correct the phase between the two ADCs.
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