SEMICONDUCTOR WAFER, METHOD OF PRODUCING A SEMICONDUCTOR WAFER AND METHOD OF PRODUCING A COMPOSITE WAFER

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United States of America Patent

SERIAL NO

14568189

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A semiconductor wafer is provided. The semiconductor wafer comprises a sacrificial layer, a first semiconductor crystal layer, and a second semiconductor crystal layer above a semiconductor crystal layer forming wafer, wherein the semiconductor crystal layer forming wafer, the sacrificial layer, the first semiconductor crystal layer and the second semiconductor crystal layer are arranged in the order of the semiconductor crystal layer forming wafer, the sacrificial layer, the first semiconductor crystal layer and the second semiconductor crystal layer, a first atom of one type selected from a plurality of types of atoms constituting the semiconductor crystal layer forming wafer or the sacrificial layer is contained in the first semiconductor crystal layer and the second semiconductor crystal layer as an impurity, and the concentration of the first atom in the second semiconductor crystal layer is lower than the concentration of the first atom in the first semiconductor crystal layer.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY3-1 KASUMIGASEKI 1-CHOME CHIYODA-KU TOKYO 100-8921
SUMITOMO CHEMICAL COMPANY LIMITED2-7-1 NIHONBASHI CHUO-KU TOKYO 103-6020

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HATA, Masahiko Phoenix, US 79 579
ITATANI, Taro Tsukuba-shi, JP 20 116
MAEDA, Tatsuro Tsukuba-shi, JP 11 89
OSADA, Takenori Tsukuba-shi, JP 14 38
TAKADA, Tomoyuki Tsukuba-shi, JP 77 521
YASUDA, Tetsuji Tsukuba-shi, JP 24 105

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