COMPONENT ANALYZING APPARATUS

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United States of America Patent

APP PUB NO 20150138538A1
SERIAL NO

14540481

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Abstract

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A component analyzing apparatus includes a base unit having a mounting part on which a measuring object is mounted and a mass measurement part that measures a mass of the measuring object, a spectroscopic camera that acquires a spectral image of the measuring object, a support unit provided on the base unit and supporting the spectroscopic camera in a location such that an imaging direction in the spectroscopic camera is a direction toward the mounting part and a distance between the mounting part and the spectroscopic camera is a predetermined distance, and a control part that analyzes components of the measuring object based on the spectral image and the mass measured by the mass measurement part.

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Patent Owner(s)

Patent OwnerAddress
SEIKO EPSON CORPORATION4-1 NISHISHINJUKU 2-CHOME SHINJUKU-KU TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
SAKURAI, Kazunori Chino, JP 37 578

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