METHODS AND APPARATUS FOR MODEL-BASED DETECTION OF STRUCTURE IN VIEW DATA
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United States of America Patent
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Issued Date -
May 21, 2015
app pub date -
Aug 19, 2014
filing date -
Jun 17, 2003
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Abandoned
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Abstract
In one aspect, a method for determining a value for at least one parameter of a configuration of a model, the model associated with structure of which view data has been obtained from at least one x-ray scanning device capable of producing x-ray radiation, the view data being obtained, at least in part, by scanning at least a portion of the structure, wherein the view data is attenuation data of the x-ray radiation attenuated by the structure as a function of view angle about the structure is provided. The method comprises acts of operating on the view data to detect at least one feature in the view data, and determining the value for the at least one parameter of the configuration of the model based, at least in part, on the at least one feature.
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