APPARATUS FOR CONTROLLING SEMICONDUCTOR CHIP CHARACTERISTICS
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United States of America Patent
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app pub date -
Dec 30, 2008
filing date -
Jun 16, 2000
priority date (Note) -
Abandoned
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Abstract
Apparatus including functional components of circuitry defined on a semiconductor chip, the functional components including a component having modifiable operating characteristics, a performance measuring circuit providing an output indicative of operating characteristics of the circuitry defined on the semiconductor chip during operation of the circuitry, and computer implemented software means for controlling a value for an operating characteristic of the component having modifiable operating characteristics in response to the output provided by the performance measuring circuit.
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