Pulsed testing of through-body-vias

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United States of America Patent

PATENT NO 9891269
SERIAL NO

13977655

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Abstract

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An integrated circuit die has one or more through-body-vias and a testing circuit on board the die which tests for defects in a through-body-via by driving of pulses of current into a node. Pulses are counted until the voltage of the node reaches a threshold voltage to provide a pulse count which is a function of the capacitance of the node. A determination is made as to whether the through-body-via of the node has a defect as a function of the pulse count.

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Patent Owner(s)

  • INTEL CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kolluru, Kalyan C Portland, US 19 37
Vukic, Mladenko Portland, US 4 64

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