METHOD FOR FITTING A STRAIGHT LINE TO DATA WITH OUTLIERS

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United States of America Patent

APP PUB NO 20150161471A1
SERIAL NO

14102975

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Abstract

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A method for fitting a straight line for a statistics dataset (x, y) containing outliers comprising the steps of: a) receiving a statistics dataset (x, y) containing outliers; b) constructing initial interval search box [m,c] for slope and intercept for received statistics dataset (x, y); c) formulating an objective function based on initial search box; d) obtaining an equation of line model by representing it in interval domain; e) processing interval residuals by taking the difference between response variable and estimation of response variable in interval domain; f) evaluating interval Tukey's biweight function by deciding the outlierness of any data point by comparing the robust median of absolute deviation of interval residuals and absolute value of interval residual for that point; g) finding the estimates of slope and intercept by using vectorized version of interval global optimization process; and h) fitting a straight line for the statistics dataset (x, y) based on the estimates of slope and intercept.

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Patent Owner(s)

Patent OwnerAddress
INDIAN INSTITUTE OF TECHNOLOGY BOMBAYMUMBAI 400 076 MAHARASHTRA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
MODI, Chintankumar K Petlad, IN 1 0
NATARAJ, Paluri Satya Vydeeswara Mumbai, IN 1 0

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