Four corner high performance depth test
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United States of America Patent
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Feb 14, 2017
Grant Date -
Jun 25, 2015
app pub date -
Dec 20, 2013
filing date -
Dec 20, 2013
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Abstract
One or more apparatus and method for multi-pixel/sample level depth testing in a graphics processor is described. In embodiments, a bounding-box of variable size over which a depth test is to be performed is determined based on the pattern of lit pixels or samples within rasterizer tile. A multi-corner depth test may be performed between a source depth data plane and a destination depth plane within a source depth data bound where destination depth data is continuous within the source data bound. A range-based depth test may be performed in response to the destination data being discontinuous. Source depth data prevailing in the depth test may be stored in a compressed plane equation format in response to the source data being continuous within the source data bound, and may be stored as min/max depth data if discontinuous.
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