Distortion measurement for limiting jitter in PAM transmitters

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United States of America Patent

PATENT NO 9344203
APP PUB NO 20150180592A1
SERIAL NO

14638507

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Abstract

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Methods and test equipment for measuring jitter in a Pulse Amplitude Modulated (PAM) transmitter. Under one procedure, a first two-level PAM signal test pattern is used to measure clock-related jitter separated into random and deterministic components, while a second two-level PAM signal test pattern is used to measure even-odd jitter (EOJ). Under another procedure, A four-level PAM signal test pattern is used to measure jitter-induced noise using distortion analysis. Test equipment are also disclosed for implementing various aspects of the test methods.

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Patent Owner(s)

  • INTEL CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ran, Adee O Maayan Baruch, IL 33 320

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