Spectrometry system, spectroscopic module, and positional deviation detection method

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United States of America Patent

PATENT NO 9797774
APP PUB NO 20150185081A1
SERIAL NO

14580848

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Abstract

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A spectrometry system includes an imaging apparatus that includes an imaging element which captures an image, and a spectroscopic module that includes a wavelength variable interference filter and an attachment unit which holds the wavelength variable interference filter, is provided to be attachable to and detachable from the imaging apparatus, and can dispose the wavelength variable interference filter on an optical path of incident light to the imaging element during attachment to the imaging apparatus.

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Patent Owner(s)

  • SEIKO EPSON CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hirokubo, Nozomu Fujimi, JP 45 209
Nagate, Takashi Suwa, JP 17 526
Sakurai, Kazunori Chino, JP 37 578
Sano, Akira Shiojiri, JP 119 648

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