Pesticide Residue Detection Method

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United States of America Patent

APP PUB NO 20150185153A1
SERIAL NO

14575381

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Abstract

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Embodiments of the present invention disclose a pesticide residue detection method, comprising the steps: (a) irradiating a sample to be detected by an exciting light and collecting a Raman scattered light from the sample; (b) acquiring a Raman spectrum of the sample from the collected Raman scattered light; and (c) comparing the Raman spectrum with reference Raman spectra for known pesticides in a reference Raman library to determine composition and concentration of the pesticide residue in the sample. The method may achieve effective, convenient and accurate inspection of the pesticide residue in foods, in particular suitable for rapid detection.

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Patent Owner(s)

Patent OwnerAddress
NUCTECH COMPANY LIMITEDTONGFANG BUILDING SHUANGQINGLU HAIDIAN DISTRICT BEIJING 100084

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jiang, Li Beijing, CN 321 3869
Wang, Hongqiu Beijing, CN 34 52
Yi, Yumin Beijing, CN 25 107
Zhang, Jianhong Beijing, CN 28 43
Zhang, Li Beijing, CN 2407 31906

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