TESTING A WIDE FUNCTIONAL INTERFACE OF A DEVICE INTEGRATED ON AN SIP WITHOUT DEDICATED TEST PINS
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United States of America Patent
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Jul 2, 2015
app pub date -
Dec 28, 2013
filing date -
Dec 28, 2013
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Abstract
A test interface mode over general purpose input/output peripheral connectors of a multichip package (MCP) or system in package (SIP) for an integrated device chip having a wide functional interface. The wide functional interface has more signals than there are available external connectors on the SIP package. Logic in the SIP package includes selection logic to select one or more portions of the wide functional interface to test in a given cycle. Logic in the SIP package multiplexes peripheral connectors as a test interface for the device chip, instead of dedicating connectors on the SIP package for a direct access test interface.
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