Integrated circuit defect detection and repair
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United States of America Patent
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Jan 17, 2017
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N/A
app pub date -
Jun 30, 2014
filing date -
Dec 26, 2013
priority date (Note) -
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Abstract
In accordance with the present description, a device includes an internal defect detection and repair circuit which includes a self-test logic circuit built in within the device and a self-repair logic circuit also built in within the device. In one embodiment, the built in self-test logic circuit may be configured to automatically identify defective memory cells in a memory. Upon identifying one or more defective memory cells, the built in self-repair logic circuit may be configured to automatically repair the defective memory cells by replacing defective cells with spare cells within the memory.
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