Overheat protection circuit and method in an accelerated aging test of an integrated circuit

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United States of America Patent

PATENT NO 10371745
APP PUB NO 20150204941A1
SERIAL NO

14162282

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Abstract

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To include in a device a controller to control operation of the device in a normal-operation mode and in a test mode for performing one or more tests including an accelerated aging test, a temperature sensor to measure operating temperature of the device, and an overheat protection circuit to prevent overheating of the memory device during the test mode. With this overheat protection circuit, a device may undergo an efficient and reliable accelerated aging test with reduced or non-existent, possibility of suffering an overheat damage.

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Patent Owner(s)

  • MICRON TECHNOLOGY INC.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Brox, Martin Munich, DE 132 657
Ocon-Garrido, Juan-Antonio Munich, DE 1 4
Schneider, Ronny Munich, DE 14 34

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