Method of measuring shutter time lag, display device for measuring shutter time lag, shutter time lag measurement apparatus, method of manufacturing camera, method of measuring display delay of camera, and display delay measurement apparatus

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United States of America Patent

PATENT NO 9565425
SERIAL NO

14434302

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Abstract

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A method of measuring a shutter time lag of a camera includes: a first step of switching a display pattern of a display unit including i (i is a natural number greater than 2) display elements to a different display pattern at every time TP, and in the first step, the number of j (j is a natural number, and 1

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Patent Owner(s)

  • SEIKO EPSON CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ichikawa, Tatsuya Nagano, JP 37 209
Shiohara, Ryuichi Nagano, JP 128 1392

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