Alignment marking for rock sample analysis

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United States of America Patent

PATENT NO 9552958
APP PUB NO 20150243471A1
SERIAL NO

14189506

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Abstract

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A method for using a Focused Ion Beam and/or Scanning Electron Microscope (FIB/SEM) for etching one or more alignment markers on a rock sample, the one or more alignment markers being etched on the rock sample using the FIB/SEM. The one or more alignment markers may further be deposited with a platinum alloy or other suitable compositions for increasing alignment marker visibility.

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Patent Owner(s)

  • WEATHERFORD TECHNOLOGY HOLDINGS, LLC

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hooghan, Kultaransingh N Houston, US 5 65

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