REFRACTIVE-INDEX DISTRIBUTION MEASURING METHOD, REFRACTIVE-INDEX DISTRIBUTION MEASURING APPARATUS, METHOD OF MANUFACTURING OPTICAL ELEMENT, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM
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United States of America Patent
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Issued Date -
Sep 17, 2015
app pub date -
Mar 13, 2015
filing date -
Mar 14, 2014
priority date (Note) -
Abandoned
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Abstract
A refractive-index distribution measuring method includes the steps of measuring a transmitted wavefront of an object, determining a first refractive index distribution of the object based on a measurement result of the transmitted wavefront, determining a third refractive index distribution in a transmission direction of light of the transmitted wavefront based on information related to a second refractive index distribution of the object, and calculating a three-dimensional refractive index distribution of the object based on the first refractive index distribution and the third refractive index distribution.
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