SUBSTRATE FOR SEMICONDUCTOR DEVICES, METHOD OF MANUFACTURING SUBSTRATE FOR SEMICONDUCTOR DEVICES, AND SOLID-STATE IMAGING DEVICE

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United States of America Patent

APP PUB NO 20150263212A1
SERIAL NO

14635303

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Abstract

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According to one embodiment, a substrate for semiconductor devices includes a P-type semiconductor substrate, a P-type or N-type semiconductor layer, and a P-type or N-type epitaxial layer. The P-type or N-type semiconductor layer is provided at a surface layer of the semiconductor substrate and has a resistance value lower than a resistance value of the semiconductor substrate. The P-type or N-type epitaxial layer is provided on a surface of the semiconductor layer and has a resistance value higher than the resistance value of the semiconductor layer.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA TOSHIBAMINATO-KU TOKYO 105-8001

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kageyama, Mokuji Oita, JP 14 212
Numata, Hideo Ota, JP 52 593
Tanaka, Nagataka Oita, JP 47 672
UYA, Shinji Oita, JP 44 516

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