PARALLEL MULTIPLEX TEST SYSTEM AND METHOD
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United States of America Patent
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Sep 24, 2015
app pub date -
Apr 28, 2014
filing date -
Mar 18, 2014
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Abstract
A parallel multiplex test system is disclosed. The parallel multiplex test system is used for testing N devices under test (DUTs) in the N isolation boxes via N test signals through N test channels. The parallel multiplex test system comprises a central processing unit and N function-test modules, wherein N is a positive integer greater than one. The parallel multiplex test system requests the function-test modules to take the function-tests for N DUTs according to the test items which have not been tested, so that different function-tests are taken for all of the DUTs simultaneously through different channels.
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