AUTOMATED QUANTIFICATION OF MICROORGANISM GROWTH PARAMETERS THROUGH TEMPORALLY RESOLVED MICROSCOPIC IMAGING

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United States of America Patent

SERIAL NO

14435019

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Abstract

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A method of high-density, multiparameter growth analysis founded upon modeling microcolony expansion on solid media is described. The method extracts the key growth parameters (lag time, doubling time, carrying capacity and viability) that together define microcolony growth from seeded cells. The invention relates to a method to determine growth parameters of cells that is scalable, time-resolved and quantitative.

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Patent OwnerAddress
INSTITUTE FOR SYSTEMS BIOLOGY401 TERRY AVE N SEATTLE WA 98109

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aitchison, John Seattle, US 2 1
Dilworth, David Seattle, US 2 1
Ratushny, Alex Seattle, US 1 1

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