Test system and test method

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United States of America Patent

PATENT NO 10019793
SERIAL NO

14672418

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ATTORNEY / AGENT: (SPONSORED)

Importance

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Abstract

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According to an embodiment, A test system includes: a moving unit configured to move a test object, the test object including a first surface, a mark being printed on the first surface; a first imaging device configured to photograph the first surface of test object to obtain a first image; a cutter configured to scratch the first surface; a first unit configured to attach a tape to the first surface; a second unit configured to detach the tape from the first surface; a second imaging device configured to photograph the first surface after detaching the tape to obtain a second image; and a controller configured to compare the first image and the second image to output a comparison result.

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First Claim

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Patent Owner(s)

  • TOSHIBA MEMORY CORPORATION

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Iizuka, Kazuhiro Yokohama, JP 11 43
Noma, Kohei Setagaya, JP 7 7

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