Method for the automatic parameterization of the error detection of an image inspection system
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United States of America Patent
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Sep 12, 2017
Grant Date -
Oct 1, 2015
app pub date -
Mar 31, 2015
filing date -
Mar 31, 2014
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Abstract
A method automatically parameterizes error detection of an image inspection system by a computer. The method includes digitizing a reference image in order to determine desired values and subdividing the reference image into homogeneous image regions with few edges, and inhomogeneous image regions with strongly structured image areas and many edges. Lower tolerance values for the homogeneous image regions, and higher tolerance values for the inhomogeneous image regions of the digitized reference image are determined by statistical image analyses. The determined tolerances are assigned to their respective desired values in dependence on a position of the desired values in homogeneous or inhomogeneous image regions. An inspection sensitivity is calculated from desired values and their respective tolerances. The parameters of the image inspection system are set with the aid of the inspection sensitivity configuration of the image inspection system using the parameters.
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