Method and System for Intrinsic LED Heating for Measurement
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United States of America Patent
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Nov 5, 2015
app pub date -
Apr 29, 2015
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May 2, 2014
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Abstract
The present disclosure provides methods and apparatus for testing light-emitting diodes (LEDs), for example, measuring the optical radiation of an LED. In a method, a pulse-width modulated signal is provided to the LED. One or more characteristics of the PWM signal are varied so as to provide a forward voltage, Vf, corresponding to a target junction temperature, Tj, of the LED. The optical radiation of the LED is measured when the LED obtains the target junction temperature.
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