CHIP INSTRUMENTATION FOR IN-SITU CLOCK DOMAIN CHARACTERIZATION
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United States of America Patent
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Issued Date -
Nov 5, 2015
app pub date -
Jun 11, 2015
filing date -
May 31, 2013
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Abstract
Chip instrumentation determines, in-situ, an allowable increase over product specification in the operating frequency of at least one clock domain in an integrated circuit for a given set of environmental, power supply and/or functionality constraints. Information on the allowable increase in operating frequency for the at least one clock domain is provided to circuits and/or software to effect change in operating frequency.
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