Systems and methods for detection and quantification of selenium and silicon in samples
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United States of America Patent
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Mar 20, 2018
Grant Date -
Nov 5, 2015
app pub date -
Jun 2, 2014
filing date -
May 1, 2014
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Abstract
The present disclosure provides methods and systems for improved detection and/or quantification of selenium (Se) and/or silicon (Si) in samples. In certain embodiment, the methods and systems feature the use of carbon dioxide (CO2) as a reaction gas in a reaction cell chamber, such as a dynamic reaction cell (DRC), of an inductively coupled plasma mass spectrometer (ICP-MS). It is found that the use of CO2 as a reaction gas effectively eliminates (or substantially reduces) interfering ionic species for the analytes Se and Si, particularly in samples with complex matrices, and/or in samples with low levels of analyte, thereby enabling more accurate detection of analyte at lower detection limits and in samples having complex matrices.
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