VOID-ARRANGED STRUCTURE AND MEASUREMENT METHOD

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United States of America Patent

SERIAL NO

14801119

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Abstract

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A void-arranged structure having a plurality of void sections that penetrate from a first principal surface toward a second principal surface. An opening shape of the void section includes at least one curved corner.

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Patent Owner(s)

Patent OwnerAddress
MURATA MANUFACTURING CO LTDNAGAOKAKYO-SHI KYOTO 617-8555

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KAMBA, SEIJI Nagaokakyo-shi, JP 35 106
Kondo, Takashi Nagaokakyo-shi, JP 478 3574

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