Defect analysis system for error impact reduction
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United States of America Patent
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Jul 26, 2016
Grant Date -
Nov 19, 2015
app pub date -
Jul 27, 2015
filing date -
Jan 14, 2013
priority date (Note) -
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status (Latency Note)
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Abstract
A first set of data associated with a plurality of data sources is analyzed to determine a plurality of relationships among the first set of data. First rules are generated first rules based, at least in part, on the first set of data, wherein a first of the first rules indicates a first software defect and a cause of the first software defect, wherein a second of the first rules indicates a solution to the first software defect. Determining that the solution to the first software defect is a possible solution to a second software defect is made based, at least in part, on the first and second of the first rules. An indication that first set of data has been modified is received. A relationship between the first set of data and a second set of data associated with the plurality of data sources is determined.
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