Method for image outlier removal for transmission electron microscope cameras
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United States of America Patent
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Aug 16, 2016
Grant Date -
Nov 19, 2015
app pub date -
Jul 30, 2015
filing date -
Aug 2, 2014
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Abstract
Methods are disclosed for removal of outlier pixels from a transmission electron microscopy camera image. One exemplary method includes establishing a desired exposure of n electrons per pixel; exposing the camera to a series of sub-frame exposures to produce a series of sub-frame images; calculating an average image signal of all sub-frame exposures in said series; establishing a threshold selected to achieve a desired number of false positives; evaluating each of said sub-frame exposures for pixels further away from said average than said threshold; and replacing pixels in each of said sub-frame images that exceed said threshold with said average to form corrected sub-frame images.
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