Imaging detector having an integrated wide bandgap layer and method of manufacturing thereof

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United States of America Patent

PATENT NO 9553116
APP PUB NO 20150357367A1
SERIAL NO

14726969

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Abstract

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A substrate-removed, surface passivated, and anti-reflective (AR) coated detector assembly is provided. The assembly has an AR coating or passivation layer which includes a wide bandgap thin-film dielectric/passivation layer integrated therein. The wide bandgap thin-film dielectric/passivation layer is positioned proximal to a back interface of a substrate-removed detector assembly. A method of manufacturing the detector assembly includes etching a backside of a partially-removed-substrate detector assembly to obtain an etched detector assembly removed from a substrate. A wide bandgap layer is deposited, in a vacuum chamber, on the etched detector assembly without utilizing an adhesive layer. Additional anti-reflective coating layers are deposited, in the same vacuum chamber, on the wide bandgap layer to form an anti-reflective coating layer with the wide bandgap layer integrated therein. The wide bandgap layer is positioned proximal to an interface portion between the anti-reflective coating layer and the detector assembly.

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Patent Owner(s)

  • TELEDYNE SCIENTIFIC & IMAGING, LLC

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kobrin, Paul H Newbury Park, US 8 496
Lee, Donald L Thousand Oaks, US 9 37
Piquette, Eric Camarillo, US 3 0
Sankur, Haluk Ventura, US 3 12
Zandian, Majid Calabasas, US 9 14

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