PARTICLE CHARACTERIZATION
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United States of America Patent
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app pub date -
Jun 21, 2013
filing date -
Jun 22, 2012
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Abandoned
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Abstract
The disclosure relates to methods and apparatus for detecting properties of heterogeneous samples, including detecting properties of particles or fluid droplets in industrial processes. Embodiments disclosed include a particle characterization method, comprising: suspending particles in a fluid; causing the suspended particles to flow past a two-dimensional array detector; illuminating the suspended particles as they flow past the two-dimensional array detector in the fluid; acquiring a plurality of images of the particles as they flow past the two-dimensional array detector in the fluid; and applying a particle characterization function to results of steps of acquiring a plurality of images for at least some of the suspended particles.
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