PREDICTING CIRCUIT RELIABILITY AND YIELD USING NEURAL NETWORKS
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Dec 24, 2015
app pub date -
Jun 10, 2015
filing date -
Jun 19, 2014
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
A system and method for predicting a product characteristic are provided. The system includes a data acquisition module configured to acquire raw data associated with to-be predicted prediction information, a data conversion module configured to convert the raw data into computable normalized data, and a result prediction module configured to calculate a prediction result based on the normalized data and compare the prediction result with a predetermined standard value. The result prediction module includes a neural network prediction model configured to calculate the prediction result based on the normalized data. The prediction information may include reliability and/or yield to prevent major reliability or yield problems from occurring during manufacturing of semiconductor devices.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully