Method and apparatus for processing signals of semiconductor detector

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United States of America Patent

PATENT NO 9835739
SERIAL NO

14800635

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Abstract

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The present invention provides a method and apparatus for processing signals of a semiconductor detector, including: acquiring a relationship of a time difference between anode and cathode signals of the semiconductor detector with an anode signal amplitude; obtaining an optimal data screening interval according to the relationship of the time difference between anode and cathode signals of the semiconductor detector with the anode signal amplitude, wherein the optimal data screening interval is an interval where the time difference between the anode and cathode signals is greater than 50 ns; and screening and processing the collected data according to the optimal data screening interval when the semiconductor detector collects data. The present invention better overcomes the inherent crystal defects of the detector, reduces the effect of background noise, increases the energy resolution of the cadmium zinc telluride detector under room temperature, and improves the peak-to-compton ratio.

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Patent Owner(s)

  • NUCTECH COMPANY LIMITED;TSINGHUA UNIVERSITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Du, Yingshuai Beijing, CN 8 8
Fu, Jianqiang Beijing, CN 5 7
Li, Jun Beijing, CN 1261 16348
Li, Yuanjing Beijing, CN 271 1888
Li, Yulan Beijing, CN 51 170
Ma, Xuming Beijing, CN 11 7
Zhang, Lan Beijing, CN 128 1429
Zhang, Wei Beijing, CN 2319 17796

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