AUTOMATED DEFLECTOMETRY SYSTEM FOR ASSESSING REFLECTOR QUALITY

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United States of America Patent

SERIAL NO

14806627

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An automated deflectometry system and method for assessing the quality of a reflective surface for use in a concentrating solar power plant. The deflectometry system comprises a holding fixture for mounting a heliostat reflector opposite a target screen having a known pattern. Digital cameras embedded in the target screen take pictures of the known pattern as reflected in the surface of the reflector. Image processing software then detects the features of the pattern in the reflector images and calculates the slope profile of the reflective surface. The slope field can be calculated by comparing the images of the reflective surface to those of a reference surface. Based on the slope profile of the reflective surface, a ray tracing calculation can be performed to simulate flux as reflected from the reflective surface onto a receiver and a quality metric can be ascribed to the heliostat reflector. The result of the quality assessment can displayed using a graphical user interface on an automated assembly line.

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Patent Owner(s)

Patent OwnerAddress
AALBORG CSPHJULMAGERVEJ 55 9000 AALBORG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Risner, Jeremy Port Clinton, US 3 12
Zavodny, Maximilian Pasadena, US 6 42

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