Slurry for Selective Chemical Mechanical Polishing of Copper

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United States of America Patent

APP PUB NO 20160040040A1
SERIAL NO

14456356

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A slurry for selective chemical mechanical polishing of a copper layer is disclosed. The slurry includes either porous zeolite abrasive particles of substantially homogeneous composition having an average pore diameter of approximately 0.1-6 nanometers or hexagonal boron nitride abrasive particles. The slurry also includes an organic complexing compound that is 0.1-25 wt. % of the slurry, an oxidizer that is 0.1-10 wt. % of the slurry, and a solvent. A chemical mechanical polishing method for using the slurry is also disclosed.

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Patent Owner(s)

Patent OwnerAddress
APPLIED MATERIALS INC3050 BOWERS AVENUE SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Arnepalli, Ranga Rao Veeravalli, IN 23 858
Bajaj, Rajeev Fremont, US 158 3036
Goradia, Prerna Mumbai, IN 31 567
Purkayastha, Arup Mumbai, IN 3 14
Visser, Robert Jan Menlo Park, US 127 2016

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