METHOD FOR CHECKING RESULT OF CHIP PROBING TEST AND CHIP THEREOF
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United States of America Patent
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Issued Date -
Feb 25, 2016
app pub date -
Aug 22, 2014
filing date -
Aug 22, 2014
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A chip having information of a result of a chip probing test and a method for checking the results of the chip probing test are disclosed. The chip includes a chip substrate and a record module located on the chip substrate. The record module is configured to record a status code indicating whether the chip passes the chip probing test. The method includes following steps: executing the chip probing test for the chip; and recording the status code in the record module of the chip, the status code indicating whether the chip passes the chip probing test.
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