STRUCTURE AND METHOD TO MINIMIZE WARPAGE OF PACKAGED SEMICONDUCTOR DEVICES

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United States of America Patent

SERIAL NO

14472882

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Abstract

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A packaged semiconductor device includes a substrate, an electronic device coupled to the substrate, encapsulant including a first major surface surrounding the electronic device, and an oxygen barrier layer within fifty percent of a thickness of the encapsulant from a second major surface of the encapsulant. The oxygen barrier covers at least a portion of an area of the second major surface of the encapsulant to help reduce or eliminate warping of the encapsulant and/or the substrate of the packaged semiconductor device due to oxidation. A thickness of the oxygen barrier layer is less than 100 microns.

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Patent Owner(s)

Patent OwnerAddress
NXP B V F/K/A FREESCALE SEMICONDUCTOR INC5656 AG HIGH TECH CAMPUS 60 EINDHOVEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
GUAJARDO, JAMES R GEORGETOWN, US 4 6
LAKHERA, NISHANT AUSTIN, US 21 43
MATHEW, VARUGHESE AUSTIN, US 41 347
SINGH, AKHILESH K AUSTIN, US 10 19

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