Importance

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Abstract

A measurement apparatus includes at least two or more radiation devices, at least two or more image capturing devices, and a measurement device. Each of the radiation devices radiates light such that a part of a radiation pattern overlaps a part of a radiation pattern from another one of the radiation devices on a measurement target. Each of the image capturing devices captures an image of a radiation region of the measurement target on which the radiation pattern of a specific wavelength light radiated by one of the radiation devices that is paired with the image capturing device is projected, through a specific wavelength pass filter that allows passage of light of a specific wavelength of the paired radiation device and blocks light of a wavelength except the specific wavelength.

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First Claim