MASS MICROSCOPE APPARATUS
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United States of America Patent
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Issued Date -
Apr 7, 2016
app pub date -
Oct 2, 2015
filing date -
Oct 6, 2014
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A mass microscope apparatus includes: a measuring unit including an ionization unit configured to ionize a sample present in an observation region, and a mass spectrometry unit configured to perform mass spectrometry of ions generated by the ionization unit; an object moving device configured to relatively move the observation region as to the sample; and a switching unit configured to switch measurement conditions of the measuring unit depending on whether the mass microscope apparatus is operating in a moving measurement mode where the observation region is moved by the object moving device to sequentially perform measurement by the measuring unit, and a stationary measurement mode where the observation region is stationary and measurement is performed by the measuring unit.
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