DIAGNOSTIC APPARATUS

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20160116533A1
SERIAL NO

14921242

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A diagnostic apparatus is disclosed, which includes a processor configured to extract, from a plurality of components included in an integrated circuit to be diagnosed, a failure candidate based on test results obtained from actual operations of the integrated circuit, the actual operations being implemented by individually applying a plurality of types of test patterns to the integrated circuit, extract, from a plurality of pass patterns of the test patterns, a pass pattern with which a signal is transmitted to the failure candidate, based on log data obtained from simulations with the test patterns, the test results of the plurality of pass patterns being normal, and execute, using a fail pattern of the test patterns and the extracted pass patterns, a failure simulation assuming that the failure candidate is failed, the test result of the fail pattern being abnormal.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
FUJITSU LIMITEDKAWASAKI18047
SOCIONEXT INC.KANAGAWA, JP3556

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Banno, Koji Kawasaki, JP 13 92
ISHIDA, Tsutomu Kawasaki, JP 89 619

Cited Art Landscape

Patent Info (Count) # Cites Year
 
Other [Check patent profile for assignment information] (1)
* 7266741 Generation of test vectors for testing electronic circuits taking into account of defect probability 7 2004
 
NEC CORPORATION (1)
* 2006/0236,186 Test Output Compaction with Improved Blocking of Unknown Values 3 2006
 
MENTOR GRAPHICS CORPORATION (4)
* 5737340 Multi-phase test point insertion for built-in self test of integrated circuits 24 1996
* 2005/0240,887 Generating test patterns having enhanced coverage of untargeted defects 13 2004
* 2007/0168,789 Queuing methods for distributing programs for producing test data 6 2005
* 2007/0250,749 Test generation methods for reducing power dissipation and supply currents 7 2007
 
FREESCALE SEMICONDUCTOR, INC. (1)
* 5390193 Test pattern generation 22 1992
 
KABUSHIKI KAISHA TOSHIBA (4)
* 6766473 Test pattern selection apparatus for selecting test pattern from a plurality of check patterns 29 2001
* 2004/0133,833 Apparatus for selecting test patterns for logic circuit, computer implemented method for selecting test patterns, and computer program product for controlling a computer system so as to select test patterns 0 2003
* 2005/0015,691 Semiconductor integrated circuit device and test method thereof 0 2004
* 7464296 System and method for identifying failure candidates in a semiconductor apparatus 0 2005
 
NEC ELECTRONICS CORPORATION (1)
* 6751767 Test pattern compression method, apparatus, system and storage medium 17 2000
* Cited By Examiner

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