RESPONSE VALIDATION MECHANISM FOR TRIGGERING NON-INVASIVE RE-TEST ACCESS OF INTEGRATED CIRCUITS
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United States of America Patent
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Issued Date -
Apr 28, 2016
app pub date -
May 16, 2014
filing date -
May 16, 2014
priority date (Note) -
Abandoned
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Abstract
In an embodiment of the invention, response validation offers increased integrated circuit security by using a unique password or re-test key for every integrated circuit manufactured. Non-invasive re-test of an IC can be performed using an encryption input.
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