Method of measuring characteristics of crystal unit

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United States of America Patent

PATENT NO 9778096
SERIAL NO

14875988

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of measuring characteristics of a crystal unit, includes: driving a crystal unit having a cover transmitting light, a crystal substrate, a first excitation electrode disposed on a first surface of the crystal substrate facing the cover, and a second excitation electrode disposed on a second surface of the crystal substrate opposite to the first surface; irradiating light to the first excitation electrode through the cover in the driving state of the crystal unit; and measuring vibration characteristics of the crystal unit based on reflected light obtained from the irradiated light.

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Patent Owner(s)

  • FUJITSU LIMITED

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Itoh, Masayuki Kawasaki, JP 108 426
Kishi, Masakazu Kawasaki, JP 44 133
Kubota, Hajime Kawasaki, JP 60 276

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