Eddy current flaw detection device, eddy current flaw detection method, and eddy current flaw detection program

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United States of America Patent

PATENT NO 10001458
SERIAL NO

14781851

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Abstract

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There is provided an eddy current flaw detection technique capable of, even when inspecting an object having a narrow portion with a small curvature radius, recognizing detection sensitivity change due to change of attitude of a probe.

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Patent Owner(s)

  • KABUSHIKI KAISHA TOSHIBA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ichikawa, Hiroya Yokohama, JP 8 29
Kobayashi, Noriyasu Yokohama, JP 5 7
Ueno, Souichi Ota, JP 9 7

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