SEMICONDUCTOR-BASED PHOTODETECTOR HAVING MULTIPLE OPTICAL FEEDS FOR COUPLING LIGHT INTO AN ACTIVE AREA THEREOF

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United States of America Patent

APP PUB NO 20160124147A1
SERIAL NO

14879196

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Abstract

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We disclose a semiconductor-based photodetector having multiple optical feeds for coupling light into an active area thereof in a manner that causes the light to be distributed more-uniformly therein than in a comparable conventional photodetector. As a result, embodiments of the disclosed photodetector can handle an advantageously high optical power and generate a relatively high photocurrent before the saturation is reached. In some embodiments, the multiple optical feeds are used to reduce the size of the active area to achieve a larger effective bandwidth and/or better RF response for the photodetector without exacerbating certain detrimental effects therein, e.g., caused by the excessive heat generated by the absorbed light. In some embodiments, multiple semiconductor-based photodetectors can be optically arrayed and electrically interconnected to form a traveling-wave photodetector that preserves one or more beneficial characteristics of the individual photodetectors used therein.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
ALCATEL-LUCENT USA INC.MURRAY HILL, NJ1791

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Chia-Ming Matawan, US 111 347
Sinsky, Jeffrey H Marlboro, US 11 48

Cited Art Landscape

Patent Info (Count) # Cites Year
 
QUALCOMM INCORPORATED (1)
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AVAGO TECHNOLOGIES FIBER IP (SINGAPORE) PTE. LTD. (1)
* 2012/0219,256 OPTICAL BEAM SPLITTER FOR USE IN AN OPTOELECTRONIC MODULE, AND A METHOD FOR PERFORMING OPTICAL BEAM SPLITTING IN AN OPTOELECTRONIC MODULE 4 2012
 
NEC CORPORATION (1)
* 6212212 Optical module 5 1998
 
THE CHARLES STARK DRAPER LABORATORY, INC. (1)
* 2015/0226,830 CHIP-SCALE STAR TRACKER 0 2015
 
ECOLE POLYTECHNIQUE (1)
* 5418360 Serial optical signal distribution system and method, and optical/electrical converter for implementation thereof 7 1994
* Cited By Examiner

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