STATIC RANDOM ACCESS MEMORY FREE FROM WRITE DISTURB AND TESTING METHOD THEREOF

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United States of America Patent

APP PUB NO 20160141020A1
SERIAL NO

14543910

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Abstract

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A static random access memory (SRAM) includes a memory cell array, a row decoder, a plurality of word-line drivers and an arbiter. The memory cell array includes a plurality of memory cell rows, wherein the memory cell rows are enabled by a plurality of word-lines, respectively. The row decoder is arranged to assert one of the memory cell rows according to a row address. The plurality of word-line drivers are each coupled to the row decoder and one of the memory cell rows. The arbiter is arranged to prevent multiple memory cells at a same word-line from being accessed at a same time.

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Patent Owner(s)

Patent OwnerAddress
MEDIATEK INCNO 1 DUSING 1ST RD HSINCHU SCIENCE PARK HSINCHU 30078

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Huang, Rei-Fu Hsinchu City, TW 18 119
Huang, Shih-Huang Hsin-Chu City, TW 27 163

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