RF PARAMETER CALIBRATION METHOD

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United States of America Patent

APP PUB NO 20160146920A1
SERIAL NO

14548472

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An RF parameter calibration method comprises steps: measuring an open-circuit parameter, a short-circuit parameter and a load parameter of an RF parameter circuit of a tested object; respectively substituting measured values of the open-circuit parameter, the short-circuit parameter and the load parameter into a directivity error equation, a signal source matching error equation, and a reflection path error equation to obtain a directivity error, a signal source matching error, and a reflection path error; substituting the directivity error, the signal source matching error and the reflection path error into an RF parameter equation to work out an actual value of an RF parameter; examining whether the actual value of the RF parameter is smaller than a preset dB value; if yes, undertaking calibration; if no, returning to undertake measurements once again. The present invention can replace the expensive standard calibration kit and achieve more precise parameter calibration.

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Patent Owner(s)

Patent OwnerAddress
SIGURD MICROELECTRONICS CORPNO 436 SEC 1 PEI-SHING RD CHU-TUNG HSIN-CHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
LIN, CHIEN-HUNG SHIN-CHU, TW 169 878
LIU, CHI-CHUNG SHIN-CHU, TW 7 32
TIEN, CHING-CHENG SHIN-CHU, TW 13 256
TSAI, YI-CHENG SHIN-CHU, TW 33 205

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