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United States of America Patent

PATENT NO 9930325
SERIAL NO

14939788

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Abstract

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Methods for testing the resolution of an imaging device include forming a plurality of semiconductor devices having proximal light emitting regions, such that the light emitting regions are grouped into distinct shapes separated by a distance governed by a target resolution size. The semiconductor devices are activated by providing an input signal. Light emissions from one or more of the activated semiconductor devices are suppressed by providing one or more select signals.

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Patent Owner(s)

  • IBM CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ainspan, Herschel A New Hempstead, US 31 241
Kim, Seongwon Old Tappan, US 42 278
Stellari, Franco Waldwick, US 73 311
Weger, Alan J Mohegan Lake, US 28 186

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